Linear and nonlinear characterization of low-stress high-confinement silicon-rich nitride waveguides-Reference-Cited by-同舟云学术

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Linear and nonlinear characterization of low-stress high-confinement silicon-rich nitride waveguides

Published:2015-09-23 Issue:20 Volume:23 Page:25827
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Krückel Clemens J.,Fülöp Attila,Klintberg Thomas,Bengtsson Jörgen,Andrekson Peter A.,Torres-Company Víctor

Funder

European Research Council (ERC)

Knut och Alice Wallenbergs Stiftelse (Knut and Alice Wallenberg Foundation)

Vetenskapsrådet (Swedish Research Council)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference29 articles.

1. Ultra-low loss waveguide platform and its integration with silicon photonics

2. Multilayer Silicon Nitride-on-Silicon Integrated Photonic Platforms and Devices

3. Low-Loss Silicon Nitride AWG Demultiplexer Heterogeneously Integrated With Hybrid III–V/Silicon Photodetectors

4. TriPleX-Based Integrated Optical Ring Resonators for Lab-on-a-Chip and Environmental Detection

5. On-chip optical trapping and Raman spectroscopy using a TripleX dual-waveguide trap

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