Enhanced EIG in microwave controlled X-type atomic system

Abstract

A microwave driven five-level X-type atomic system is proposed to diffract weak probe light into higher-order directions via the phenomenon of electromagnetically induced grating. In the proposed scheme, the effect of various system and field parameters on its higher-order diffraction efficiency is studied. The present atomic scheme offers excellent control over higher-order diffraction intensities by utilizing the microwave induced quantum interference effect. It is observed that the desired first-order diffraction efficiency can be attained through optimal selection of microwave field strength and relative phase factor.