Abstract
In this study, single-phased rutile
T
i
1
-
x
I
n
x
O
2
(
x
=
0
∼
0.1
) thin films were deposited on fused
quartz substrates using a pulsed laser deposition technique. The
transmission spectra reveal that the films show good transparency in
the wavelength range of 330–900 nm. The absorption edge of the
T
i
1
-
x
I
n
x
O
2
thin films is blueshifted compared
with that of undoped
T
i
O
2
films. A single-beam
z
-scan method using a pulse laser
operating at 532 nm with a duration of 55 ps was employed to evaluate
the films’ nonlinear optical characteristics. The results show that
the prepared
T
i
1
-
x
I
n
x
O
2
films exhibit nonlinear saturable
absorption and negative nonlinear refraction properties. The doping of
In ions into
T
i
O
2
does not change the nonlinear optical
absorption significantly. However, the nonlinear refractive index of
T
i
1
-
x
I
n
x
O
2
film obviously increases with the
increasing doping of In ions. The local electron-pinned defect-dipoles
and widening bandgaps in the
T
i
1
-
x
I
n
x
O
2
thin films could be used to explain
the observed results.
Funder
National Natural Science Foundation of
China
Subject
Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics