Optical constants of thick Ti and Mn films in the spectral region from 6 to 20 eV
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics
Reference15 articles.
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1. Table-top reflectometer in the extreme ultraviolet for surface sensitive analysis;Applied Physics Letters;2009-02-09
2. Modeling of electron scattering in thin manganese films on silicon by Monte Carlo methods;Journal of Applied Physics;1996-04
3. Morphology of islanded transition-metal films on graphite studied by extreme-UV reflectivity;Physical Review B;1996-03-15
4. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92;Atomic Data and Nuclear Data Tables;1993-07
5. Optical properties of selected first-row transition metals determined by reflection electron energy loss spectroscopy;Applied Surface Science;1990-10
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