Extreme UV and x-ray scattering measurements from a rough LiF crystal surface characterized by electron micrography-Reference-Cited by-同舟云学术

Extreme UV and x-ray scattering measurements from a rough LiF crystal surface characterized by electron micrography

Published:1989-05-15 Issue:10 Volume:28 Page:1763
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Alehyane Najib,Arbaoui Mohammed,Barchewitz Robert,André Jean-Michel,Christensen Finn E.,Hornstrup Allan,Palmari Jacqueline,Rasigni Monique,Rivoira Réné,Rasigni Georges

Publisher

The Optical Society

Reference25 articles.

1. Mirror surface autocovariance functions and their associated visible scattering

2. The role of surface topography in predicting scattering at grazing incidence from optical surfaces

3. Study of surface roughness using a microdensitometer analysis of electron micrographs of surface replicas: I Surface profiles

4. Roughness Measurement of X-Ray Mirror Surfaces

5. Surface correlation function analysis of high resolution scattering data from mirrored surfaces obtained using a triple-axis x-ray diffractometer

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