Simultaneous determination of refractive index and thickness of moderately thick plane-parallel transparent glass plates using cyclic path optical configuration setup and a lateral shearing interferometer-Reference-Cited by-同舟云学术

Simultaneous determination of refractive index and thickness of moderately thick plane-parallel transparent glass plates using cyclic path optical configuration setup and a lateral shearing interferometer

Published:2012-05-31 Issue:16 Volume:51 Page:3533
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Kumar Y. Pavan,Chatterjee Sanjib

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference13 articles.

1. Noncontact thickness measurement of plane-parallel transparent plates with a lateral shearing interferometer

2. Thickness measurement of transparent glass plates using a lateral shearing cyclic path optical configuration setup and polarization phase shifting interferometry

3. A simple technique for measuring thickness distribution of transparent plates from a single image by using the sampling moiré method

4. Thickness measurement system for transparent plates using dual digital versatile disc (DVD) pickups

5. Measuring the thickness and refractive index of a thick transparent plate by an unexpanded laser beam

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