Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO_2)
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference13 articles.
1. Optical functions of silicon determined by two-channel polarization modulation ellipsometry
2. Optical Properties and Band Structure of Wurtzite-Type Crystals and Rutile
3. Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2
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