Angle-resolved scattering: an effective method for characterizing thin-film coatings
Author:
Publisher
The Optical Society
Reference18 articles.
1. Bulk scattering properties of synthetic fused silica at 193 nm
2. Influence of the substrate finish and thin film roughness on the optical performance of Mo/Si multilayers
3. Roughness evolution and scatter losses of multilayers for 193 nm optics
4. Diffraction and diffuse scattering from dielectric multilayers
5. Scattering from multilayer thin films: theory and experiment
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