Characterization of near-field ptychography-Reference-Cited by-同舟云学术

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Characterization of near-field ptychography

Published:2015-07-22 Issue:15 Volume:23 Page:19728
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Clare Richard M.,Stockmar Marco,Dierolf Martin,Zanette Irene,Pfeiffer Franz

Funder

DFG Gottfried Liebniz program

German Research Foundation (DFG)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference25 articles.

1. Phase-contrast X-ray imaging with synchrotron radiation for materials science applications

2. Phase‐Sensitive X‐Ray Imaging

3. Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources

4. Phase-contrast imaging of weakly absorbing materials using hard X-rays

5. Phase-contrast imaging using polychromatic hard X-rays

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1. Computational optical sectioning via near-field multi-slice ptychography;Optics Letters;2024-08-21

2. Near-field electron ptychography using full-field structured illumination;Microscopy;2024-07-25

3. TV-based phase retrieval for speckle coded diffraction imaging;Optics and Lasers in Engineering;2024-07

4. Lens-free reflective topography for high-resolution wafer inspection;Scientific Reports;2024-05-08

5. Near-field modulation ptychography;Speckle 2023: VIII International Conference on Speckle Metrology;2024-03-04

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