Wavelength tuning robustness optimization for a high-temperature single-mode VCSEL used in chip-scale atomic sensing systems

Abstract

In this paper, the wavelength current tuning characteristics of high-temperature-operation single-mode vertical-cavity surface-emitting lasers (VCSELs) for chip-scale atomic sensing systems are studied. Excellent wavelength current tuning robustness is helpful to improve the stability of atomic sensing systems. By optimizing the size of the oxide aperture combined with surface relief mode control technology, the single-mode VCSEL with an 8 µm oxide aperture can achieve 2.02 mW output power at 355 K, and the wavelength current tuning coefficient is ∼ 0.25 n m / m A . This excellent wavelength current tuning robustness results from the low active current density and device heat generation due to the optimized oxide aperture size.