Method for accurate measurement of wideband transmittance of thin-film coatings at large angle of incidence-Reference-Cited by-同舟云学术

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Method for accurate measurement of wideband transmittance of thin-film coatings at large angle of incidence

Published:2013-01-09 Issue:2 Volume:52 Page:226
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Liu Yongli,Zhang Jinlong,Cheng Xinbin,Wang Zhanshan

Funder

National Natural Science Foundation of China (NSFC)

Changjiang Scholars and Innovative Research Team

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference18 articles.

1. Derivation of Optical Constants of Metals from Thin-Film Measurements at Oblique Incidence

2. Multiple determination of the optical constants of thin-film coating materials

3. Determination of optical constants of thin film coating materials based on inverse synthesis

4. Simultaneous measurement of the refractive index and thickness of thin films by S-polarized reflectances

5. Problem of ambiguity in the determination of optical constants of thin absorbing films from spectroscopic reflectance and transmittance measurements

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1. The research of soft matter properties by light scattering material adding drop additive;Science and Engineering of Composite Materials;2017-09-26

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