Effective method to study the thickness-dependent dielectric functions of nanometal thin film-Reference-Cited by-同舟云学术

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Effective method to study the thickness-dependent dielectric functions of nanometal thin film

Published:2016-10-21 Issue:21 Volume:41 Page:4907
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Hu Er-Tao,Cai Qing-Yuan,Zhang Rong-Jun,Wei Yan-Feng,Zhou Wen-Chao,Wang Song-You,Zheng Yu-Xiang,Wei Wei,Chen Liang-Yao

Funder

National Natural Science Foundation of China (NSFC)

Science and Technology Commission of Shanghai Municipality (STCSM)

Chinese Academy of Sciences (CAS)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference19 articles.

1. Optical and electrical properties of optimized thin gold films as top layer of MIS solar cells

2. Nanometer-thick Au-films as antireflection coating for infrared light

3. Planar Photonics with Metasurfaces

4. Correlation between dielectric constants and enhancement of surface plasmon resonances for thin gold films

5. Enhanced Surface Plasmon Resonance on a Smooth Silver Film with a Seed Growth Layer

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