1/f noise analysis of 980 nm InGaAs/GaAs laser diodes below the lasing threshold
Author:
Funder
National Natural Science Foundation of China
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
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1. A Comprehensive Study on EDFA Characteristics: Temperature Impact
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1. Low-frequency noise measurements as an analysis and prediction tool for the reliability evaluation of 808 nm laser diodes;Applied Optics;2020-11-30
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