Tilt-ellipsometry of object surface by specular reflection for three-dimensional shape measurement
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference11 articles.
1. Measurement of surface orientations of transparent objects by use of polarization in highlight
2. Determining surface orientations of transparent objects based on polarization degrees in visible and infrared wavelengths
3. Passive 3-D shape recovery of unknown objects using cooperative polarimetric and radiometric stereo vision processes
4. Recovery of surface orientation from diffuse polarization
5. Active lighting applied to three-dimensional reconstruction of specular metallic surfaces by polarization imaging
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1. Adaptive Blocks Filling Specular Highlight Removal Algorithm;2023 6th International Conference on Electronics Technology (ICET);2023-05-12
2. Polarization-probe polarization-imaging system in near-infrared regime using a polarization grating;Scientific Reports;2022-09-10
3. Analytical determination of the complex refractive index and the incident angle of an optically isotropic substrate by ellipsometric parameters and reflectance;Applied Optics;2021-05-21
4. Analytic solutions for calculating the surface inclination of isotropic media and bare substrates by using reflection-based generalized ellipsometry;Journal of Vacuum Science & Technology B;2020-05
5. Retroreflex ellipsometry for isotropic substrates with nonplanar surfaces;Journal of Vacuum Science & Technology B;2020-01
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