Femtometer-resolved wavelength monitor based on photodiode optoelectronic chromatic dispersion with RF phase-shift amplification

Abstract

The spectral sensitivity of photodiode-based optoelectronic chromatic dispersion is enhanced by phase-shift amplification using RF interferometry. With phase-shift amplification of G = 4 ⋅ 10 4 , a peak phase-shift sensitivity of Δθ = 27 deg/pm is achieved, corresponding to a spectral resolution of Δλ res  = 1 fm. This all-electronic solid-state technology can serve as an on-chip inexpensive technique for femtometer-resolved wavelength monitoring.