Sub-nanometer height sensitivity by phase shifting interference microscopy under environmental fluctuations-Reference-Cited by-同舟云学术

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Sub-nanometer height sensitivity by phase shifting interference microscopy under environmental fluctuations

Published:2020-03-18 Issue:7 Volume:28 Page:9340
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Ahmad Azeem^ORCID,Dubey Vishesh^ORCID,Butola Ankit^ORCID,Tinguely Jean-Claude,Ahluwalia Balpreet Singh^ORCID,Mehta Dalip Singh

Funder

Department of Atomic Energy, Government of India

FP7 Ideas: European Research Council

Direktoratet for internasjonalisering og kvalitetsutvikling i høgare utdanning

Norges Forskningsråd

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference53 articles.

1. Cell refractive index tomography by digital holographic microscopy

2. Digital holographic microscopy for live cell applications and technical inspection

3. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry

4. Digital phase-shifting interferometry: a simple error-compensating phase calculation algorithm

5. Quantitative Phase Imaging Techniques for the Study of Cell Pathophysiology: From Principles to Applications

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4. Highly sensitive quantitative phase microscopy and deep learning aided with whole genome sequencing for rapid detection of infection and antimicrobial resistance;Frontiers in Microbiology;2023-04-12

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