Comparison of two techniques for reliable characterization of thin metal–dielectric films
Author:
Publisher
The Optical Society
Reference28 articles.
1. Optical properties of a metal island film close to a smooth metal surface
2. Localized plasmon excitation in metal nanoclusters as a tool to study thickness-dependent optical properties of copper phthalocyanine ultrathin films
3. Tuning of the plasmon absorption frequency of silver and indium nanoclusters via thin amorphous silicon films
4. Optical transmission of dielectric layers with metallic nanoparticles inhomogeneously distributed over the sample thickness
5. Review of the fundamentals of thin-film growth
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