Development of a variable launch attenuation and isolation measurement system for optical waveguides-Reference-Cited by-同舟云学术

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Development of a variable launch attenuation and isolation measurement system for optical waveguides

Published:2011-07-20 Issue:22 Volume:50 Page:4268
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Ives David,Ferguson Robert,Harris Subrena

Publisher

The Optical Society

Reference12 articles.

1. Limit to the Bit-Rate Capacity of Electrical Interconnects from the Aspect Ratio of the System Architecture

2. Integrated optical and electronic interconnect printed circuit board manufacturing

3. Integrated optical and electronic interconnect PCB manufacturing research

4. Interferometric optical-time-domain reflectometer to determine backscattering characterization of silica-based glass waveguides

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization of Quantum Grade Interconnects;Journal of Physics: Conference Series;2022-12-01

2. Metrology and Standardization of High Speed Pluggable Optical Interconnects;Proceedings of the 9th International Conference on Photonics, Optics and Laser Technology;2021

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