On-chip size, low-noise fringe pattern projector offering highly accurate 3D measurement

Author:

Hirose Kazuyoshi,Watanabe Koyo,Kamei Hiroki,Sugiyama Takahiro,Takiguchi YuORCID,Kurosaka YoshitakaORCID

Abstract

Fringe pattern projectors are quite useful for highly accurate three-dimensional (3D) measurement when a projector or LED array is used for illumination. We have fabricated a 0.2 mm × 0.2 mm structured light source, which was an on-chip size surface-emitting laser that utilized a holographically modulated two-dimensional (2D) photonic crystal (PC). This will make possible an extremely compact 3D measurement system that will positively impact mobile systems. However, the fringe pattern tends to cause speckle-like noise that leads to severe positional error in 3D measurement. Here we present a simple approach to projecting a low-noise fringe pattern from our surface-emitting lasers by using a one-dimensional (1D) focusing hologram. This method improves the flatness of the fringe pattern by around four times.

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Multi-focusing surface-emitting lasers;Optics Express;2023-05-08

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