Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry-Reference-Cited by-同舟云学术

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Simple multifrequency and phase-shifting fringe-projection system based on two-wavelength lateral shearing interferometry for three-dimensional profilometry

Published:2005-12-10 Issue:35 Volume:44 Page:7515
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Mehta Dalip Singh,Dubey Satish Kumar,Hossain M. Mosarraf,Shakher Chandra

Publisher

The Optical Society

Reference37 articles.

1. Overview of three-dimensional shape measurement using optical methods

2. SHAPE MEASUREMENTS ON LARGE SURFACES BY FRINGE PROJECTION

3. One-grating projection for absolute three-dimensional profiling

4. Three Dimensional Inspection Using Multistripe Structured Light

5. Phase-shifting grating projection moire´ topography

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1. Quantitative phase modulation monitoring based on a shearing interferometry fringe projection method;Optics & Laser Technology;2024-07

2. Overview of modulation techniques for spatially structured-light 3D imaging;Optics & Laser Technology;2024-02

3. Stable 3D measurement method for high dynamic range surfaces based on fringe projection profilometry;Optics and Lasers in Engineering;2023-07

4. Multilevel symmetric pattern design and optimization for high-speed and high-accuracy 3D shape measurement;Optics & Laser Technology;2020-06

5. Measurement of Freeform Optical Surfaces: Trade-Off between Accuracy and Dynamic Range;Laser & Photonics Reviews;2020-04-06

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