Author:
Tarrio C.,Spiller E.,Evans C. J.,Lucatorto T. B.,Clark C. W.
Abstract
We present preliminary results of a technique that uses deposition of
variable-thickness multilayer films to correct optical figure errors.
The multilayer technique offers the potential to make figure
corrections, such as aspherizing high-quality spherical optics,
without adding measurable roughness. Moreover, because the period of a
multilayer can be measured very accurately using x-ray diffraction, we
can easily map test depositions made on inexpensive float-glass
substrates. We have used this technique to reduce large rotationally
symmetric errors by almost an order of magnitude in a single run.
Extension to the correction of non-symmetric errors was performed by
deposition through a two-dimensional mask, which was less successful.
We have identified several sources of error in this type of deposition
and discuss means of improvement. We have devised a method using a
series of rotationally-symmetric masks and a varying-rotation-rate
substrate stage to reduce the two-dimensional problem to a series of
one-dimensional problems.