Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference5 articles.
1. A perspective on ellipsometry
2. Techniques Of Measurement Of The Polarization-Altering Properties Of Linear Optical Systems
3. Automated Mueller matrix ellipsometry
4. A new polarization‐modulated light scattering instrument
5. Polarization-Dependent Light-Scattering Measurements Using An Electro-Optical Modulator-Based Instrument
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