Lumen degradation analysis of LED lamps based on the subsystem isolation method-Reference-Cited by-同舟云学术

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Lumen degradation analysis of LED lamps based on the subsystem isolation method

Published:2018-01-31 Issue:4 Volume:57 Page:849
ISSN:1559-128X
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Ke Hong-Liang,Hao Jian,Tu Jian-Hui,Miao Pei-Xian,Wang Chao-Quan,Cui Jing-Zhong,Sun Qiang,Sun Ren-Tao

Funder

Chinese Academy of Sciences (CAS), “Cui-Can Project”

CAS, “863 Project”

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

Reference22 articles.

1. Thermal-Stability Comparison of Glass- and Silicone-Based High-Power Phosphor-Converted White-Light-Emitting Diodes Under Thermal Aging

2. Comparison of online and offline tests in LED accelerated reliability tests under temperature stress

3. Comparison of lifetime predictions with LED lamps and light source modules in accelerated aging tests;Hao,2016

4. White LED performance

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1. The Enhancement Chromatic Uniformity and Illuminating Flux of WLEDs with Dual-Layer Phosphorus Configuration;Lecture Notes in Electrical Engineering;2024

2. Revisiting multi-domain empirical modelling of light-emitting diode luminaire;Cogent Engineering;2023-12-14

3. An Experimental Investigation on the Role of LEDs on the Lifetime Performance of Consumer LED Luminaires;IEEE Access;2022

4. Health Monitoring, Machine Learning, and Digital Twin for LED Degradation Analysis;Reliability of Organic Compounds in Microelectronics and Optoelectronics;2022

5. Machine Learning and Digital Twin Driven Diagnostics and Prognostics of Light‐Emitting Diodes;Laser & Photonics Reviews;2020-10-21

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