Fourier analysis near-field polarimetry for measurement of local optical properties of thin films-Reference-Cited by-同舟云学术

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Fourier analysis near-field polarimetry for measurement of local optical properties of thin films

Published:2003-07-01 Issue:19 Volume:42 Page:3864
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Goldner Lori S.,Fasolka Michael J.,Nougier Sophie,Nguyen Hoang-Phi,Bryant Garnett W.,Hwang Jeeseong,Weston Kenneth D.,Beers Kathryn L.,Urbas Augustine,Thomas Edwin L.

Publisher

The Optical Society

Reference77 articles.

1. Optical stethoscopy: Image recording with resolution λ/20

2. Near Field Scanning Optical Microscopy (NSOM)

3. Facts and artifacts in near-field optical microscopy

4. Image contrast of dielectric specimens in transmission mode near-field scanning optical microscopy: imaging properties and tip artefacts

5. Newton’s rings in near-field optics

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1. Snapshot polarimetric imaging in multi-view microscopy;Applied Optics;2022-02-15

2. Concurrent polarization retrieval in multi-heterodyne scanning near-field optical microscopy: validation on silicon form-birefringent grating;Optics Express;2012-09-24

3. Design of a polarization-insensitive optical fiber probe based on effective parameters;SPIE Proceedings;2011-05-15

4. Design of Polarization-Insensitive Optical Fiber Probe Based on Effective Optical Parameters;Journal of Lightwave Technology;2011-04

5. Characterization in Birefringence / Diattenuation of an Optical Fiber in a Fiber-Type Polarimetry;Experimental and Applied Mechanics, Volume 6;2011

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