Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing-Reference-Cited by-同舟云学术

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Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing

Published:1996-01-15 Issue:2 Volume:21 Page:101
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Marcano O. A.,Maillotte H.,Gindre D.,Métin D.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference7 articles.

1. High-sensitivity, single-beam n_2 measurements

2. Sensitive measurement of optical nonlinearities using a single beam

3. External Self-focusing in a Two-lens System: Shift and Compression of the Focal Profile

4. Z‐scan technique using top‐hat beams

5. Eclipsing Z-scan measurement of λ/10^4 wave-front distortion

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