Oscillations in spectral behavior of total losses (1 − R − T) in thin dielectric films-Reference-Cited by-同舟云学术

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Oscillations in spectral behavior of total losses (1 − R − T) in thin dielectric films

Published:2012-06-29 Issue:14 Volume:20 Page:16129
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Amotchkina Tatiana V.,Trubetskov Michael K.,Tikhonravov Alexander V.,Janicki Vesna,Sancho-Parramon Jordi,Razskazovskaya Olga,Pervak Vladimir

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference11 articles.

1. Optical Interference Coatings 2007 Measurement Problem

2. Optical Interference Coatings 2010 Measurement Problem

3. Optical parameters of oxide films typically used in optical coating production

4. Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films

5. Reliable determination of wavelength dependence of thin film refractive index

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