Analysis of reflective Mach-Zehnder interferometry for electro-optic characterization of poled polymer films in multilayer structures
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference19 articles.
1. Simple reflection technique for measuring the electro‐optic coefficient of poled polymers
2. Determination of the electrooptic coefficient of a poled polymer film
3. Reflection measurement technique of electro‐optic coefficients in lithium niobate crystals and poled polymer films
4. On the measurement of the electro-optic properties of poled side-chain copolymer films with a modified Teng–Man technique
5. Analysis of multiple reflection effects in reflective measurements of electro-optic coefficients of poled polymers in multilayer structures
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Lock-In Free ATR Detections of Organic Thin Film Pockels Effects within and beyond Nyquist;ACS Photonics;2024-03-29
2. Chromophores with side isolate groups and applications in improving the poling efficiency of second non-linear optical (NLO) materials;Dyes and Pigments;2019-03
3. Modification of a Teng-Man technique to measure both r33 and r13 electro-optic coefficients;Applied Physics Letters;2014-09-15
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