Prediction of the bidirectional reflectance-distribution function from atomic-force and scanning–tunneling microscope measurements of interfacial roughness-Reference-Cited by-同舟云学术

Prediction of the bidirectional reflectance-distribution function from atomic-force and scanning–tunneling microscope measurements of interfacial roughness

Published:1995-03-01 Issue:7 Volume:34 Page:1229
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Bruno William M.,Roth James A.,Burke Philip E.,Hewitt William B.,Holmbeck Randal E.,Neal Dennis G.

Publisher

The Optical Society

Reference10 articles.

1. Infrared light scattering from surfaces covered with multiple dielectric overlayers

2. Light scattering from semi-infinite media for non-normal incidence

3. Scattering from multilayer thin films: theory and experiment

4. Scattering and absorption of electromagnetic radiation by a semi-infinite medium in the presence of surface roughness

5. Light scattering from rough surfaces: General incidence angle and polarization

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1. Predicting reflections of thin coatings;Surface and Coatings Technology;2009-12

2. Validity of Hybrid Models for the Bidirectional Reflectance of Coated Rough Surfaces;Journal of Thermophysics and Heat Transfer;2005-10

3. The Validity of Using Thin-Film Optics in Modeling the Bidirectional Reflectance of Coated Rough Surfaces;37th AIAA Thermophysics Conference;2004-06-20

4. Scattering characteristics of Si<formula><inf><roman>3</roman></inf></formula>N<formula><inf><roman>4</roman></inf></formula> mixture surface under laser illumination;Optical Engineering for Sensing and Nanotechnology (ICOSN '99);1999-05-07

5. Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy;Applied Optics;1999-02-01