Measurements of surface roughness: use of a CCD camera to correlate doubly scattered speckle patterns
Author:
Publisher
The Optical Society
Reference3 articles.
1. Surface-roughness measurement using Fourier transformation of doubly scattered speckle pattern
2. Surface-roughness dependence of the intensity correlation function under speckle-pattern illumination
3. Tip artifacts of microfabricated force sensors for atomic force microscopy
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