Electronic speckle interferometry, phase-mapping, and nondestructive testing techniques applied to real-time, thermal loading
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Published:1995-07-01
Issue:19
Volume:34
Page:3620
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ISSN:0003-6935
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Container-title:Applied Optics
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language:en
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Short-container-title:Appl. Opt.
Author:
Wang Jianmin,Grant Ian
Publisher
The Optical Society
Cited by
19 articles.
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