Author:
Hanus Václav,Fehér Beatrix,Pápa Zsuzsanna,Budai Judit,Paul Pallabi,Szeghalmi Adriana,Dombi Péter
Abstract
This study demonstrates a serialized carrier-envelope phase (CEP) measurement using a 250-nm 2D heterostructure, revealing measurable CEP shifts suitable for PHz optoelectronics, advancing the potential for CEP-based communication networks.