Optical multi-context scrubbing operation on a redundant system

Author:

Ando Kakeru,Watanabe Minoru,Watanabe Nobuya

Abstract

This paper presents a proposal of the world-first optical multi-context scrubbing operation on a redundant system that can maintain the state of a sequential circuit and the operation continuously without any interruption on a radiation-hardened optically reconfigurable gate array even after a permanent failure suddenly happens on the sequential circuit or a flip-flop by radiation. Up to now, a high-speed optical scrubbing operation has been demonstrated on a radiation-hardened optically reconfigurable gate array. In addition, a multi-context scrubbing operation based on the high-speed optical scrubbing operation has already been demonstrated. Although the multi-context scrubbing operation presents the benefit that it can treat both soft-errors and permanent failures caused by radiation simultaneously, the conventional contributions have never presented how to maintain the state of a sequential circuit after a permanent failure occurs on flip-flops. Therefore, in the conventional multi-context scrubbing operation, all the operations must be restarted from the initial condition each time a permanent failure occurs on a programmable gate array. As a result, conventional multi-context scrubbing operations could not be applied for real-time systems. The proposed optical multi-context scrubbing method that can solve the issue has been experimentally evaluated on a radiation-hardened optically reconfigurable gate array.

Funder

Initiatives for Atomic Energy Basic and Generic Strategic Research

Ministry of Education, Culture, Sports, Science and Technology

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Radiation-hardened programmable two-phase clock generator;2024 International Electronics Symposium (IES);2024-08-06

2. Voltage Range Evaluation of An Optically Reconfigurable Gate Array VLSI;2024 IEEE 35th International Conference on Application-specific Systems, Architectures and Processors (ASAP);2024-07-24

3. Fast-neutron soft-error tolerance experimentation with a radiation-hardened optically reconfigurable gate array;2024 IEEE International Conference on Consumer Electronics (ICCE);2024-01-06

4. Remote monitoring system for optically reconfigurable gate arrays in radiation environments;2024 IEEE International Conference on Consumer Electronics (ICCE);2024-01-06

5. Parallel configuration experiment for a radiation-hardened optically reconfigurable gate array with a holographic polymer-dispersed liquid crystal memory;2024 IEEE International Conference on Consumer Electronics (ICCE);2024-01-06

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