Partial-wave microscopic spectroscopy detects subwavelength refractive index fluctuations: an application to cancer diagnosis-Reference-Cited by-同舟云学术

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Partial-wave microscopic spectroscopy detects subwavelength refractive index fluctuations: an application to cancer diagnosis

Published:2009-02-12 Issue:4 Volume:34 Page:518
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Subramanian Hariharan,Pradhan Prabhakar,Liu Yang,Capoglu Ilker R.,Rogers Jeremy D.,Roy Hemant K.,Brand Randall E.,Backman Vadim

Funder

National Institutes of Health (NIH)

V Foundation

National Science Foundation (NSF)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference9 articles.

1. In situ Assessment of Intraepithelial Neoplasia in Hamster Trachea Epithelium Using Angle-Resolved Low-Coherence Interferometry

2. Localization of light in coherently amplifying random media

3. Wave propagation in one-dimensional disordered structures

4. Invariant imbedding approach to localization. I. General framework and basic equations

5. Elastic backscattering spectroscopic microscopy

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