Using coherent X-ray ptychography to probe medium-range order-Reference-Cited by-同舟云学术

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Using coherent X-ray ptychography to probe medium-range order

Published:2013-11-07 Issue:23 Volume:21 Page:28019
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Torrance A. T. J.,Abbey B.,Putkunz C. T.,Pelliccia D.,Balaur E.,Williams G. J.,Vine D. J.,Nikulin A. Y.,McNulty I.,Quiney H. M.,Nugent K. A.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference37 articles.

1. The structure of amorphous hydrogenated silicon and its alloys: A review

2. Fluctuation microscopy – a tool for examining medium-range order in noncrystalline systems

3. Preparation, structure, dynamics, and energetics of amorphous silicon: A molecular-dynamics study

4. Medium-range order in amorphous silicon measured by fluctuation electron microscopy

5. The origin of the first sharp diffraction peak in the structure factor of covalent glasses and liquids

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 相干衍射成像技术的最新进展：层叠相位重建技术;Laser & Optoelectronics Progress;2022

2. Phase Imaging Based on Ptychography and Progress on Related Key Techniques;Acta Optica Sinica;2020

3. Characteristics of angular cross correlations studied by light scattering from two-dimensional microsphere films;Physical Review E;2014-07-31

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