Affiliation:
1. CONACYT—Instituto Politécnico Nacional
2. Instituto Politécnico Nacional
Abstract
Fringe projection profilometry requires calibrating both cameras and projectors for metric measurements. Cameras are relatively simple to calibrate, but projectors require more sophisticated procedures. In this paper, a fringe projection profilometer with two calibrated cameras and one uncalibrated projector is developed for metric measurements. A phase rectification method, which is crucial for stereo matching, is designed by minimizing the perspective distortion. Also, a simple method for point matching using stereo rectified phase maps is proposed. The principles of metric profilometry using the proposed rectification method are introduced. The developed system is evaluated experimentally by the metric measurement of three-dimensional objects. The obtained results confirm a high accuracy of metric measurement and versatility in the design of fringe projection profilometers with uncalibrated projectors.
Funder
Consejo Nacional de Ciencia y Tecnología
Instituto Politécnico Nacional
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
Cited by
1 articles.
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