Probe beam size effect on the measurement of the distance between the probe beam and the sample in photothermal deflection
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference11 articles.
1. Thermal diffusivity measurement of micron-thick semiconductor films by mirage detection
2. On the photodeflection method applied to low thermal diffusivity measurements
3. Thermophysical characterization of artificially aged papers by means of the photothermal deflection technique
4. Continuous-wave photothermal deflection spectroscopy with fundamental and harmonic responses
5. Thermophysical property measurements using time-resolved photothermal deflection spectrometry with step optical excitation
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