Extended autofocusing in dual-wavelength digital holography

Author:

Hou Sibing,Zhang Haiyu,Ma Bole,Cai PingORCID,Zu Peng1,Lei Lihua2,Fu Yunxia2,Yan Hao

Affiliation:

1. National Metrology Center (NMC)

2. Shanghai Institute of Measurement and Testing Technology

Abstract

In single-wavelength digital holography (DH), the phase wrapping phenomenon limits the total object depth that can be measured due to the requirement for well-resolved phase fringes. To address this limitation, dual-wavelength DH is proposed, enabling measurement of much deeper objects. In single-wavelength DH, because the object depth is limited, the depth of focus (DOF) of DH’s optical system at a reconstruction distance is sufficient to cover the object depth. To date, many autofocusing algorithms have been proposed to obtain a correct reconstruction distance. However, in dual-wavelength DH, because the object depth is extended, the DOF at a reconstruction distance cannot cover the extended object depth. The extended object depth can span multiple DOFs, causing partially out of focus object depth. Therefore, in dual-wavelength DH, relying solely on autofocusing algorithms for a single distance is insufficient. But extended autofocusing algorithms, which can autofocus objects through multiple DOFs, are demanded. However, there are no such extended autofocusing algorithms in dual-wavelength DH. Therefore, we propose an extended autofocusing algorithm for dual-wavelength DH based on a correlation coefficient. The proposed algorithm is able to focus the whole object depth when the depth spans multiple DOFs. Through theoretical analysis, simulations, and experiments, the necessity and effectiveness of the proposed algorithm are verified.

Funder

National Natural Science Foundation of China

Opening Fund of Shanghai Key Laboratory of Online Detection and Control Technology

National Key Research and Development Program of China

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

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