Author:
Cheng Hao-Tien,Zhang Taixian,Yang Yun-Cheng,Liu Te-Hua,Wu Chao-Hsin
Abstract
Investigation on the failure mechanisms of 850 nm vertical-cavity surface-emitting laser (VCSEL) chips in the high-temperature operating life (HTOL) stress tests are presented. Selected failed chips are put into further analysis to study their early failure mechanisms.