Full optical characterization of coherent x-ray nanobeams by ptychographic imaging-Reference-Cited by-同舟云学术

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Full optical characterization of coherent x-ray nanobeams by ptychographic imaging

Published:2011-08-10 Issue:17 Volume:19 Page:16324
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Hönig Susanne,Hoppe Robert,Patommel Jens,Schropp Andreas,Stephan Sandra,Schöder Sebastian,Burghammer Manfred,Schroer Christian G.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference25 articles.

1. Non-destructive and quantitative imaging of a nano-structured microchip by ptychographic hard X-ray scanning microscopy

2. Ptychographic X-ray computed tomography at the nanoscale

3. Hard and soft X-ray microscopy and tomography in catalysis: bridging the different time and length scales

4. Probing the structure of heterogeneous diluted materials by diffraction tomography

5. Mapping the local nanostructure inside a specimen by tomographic small-angle x-ray scattering

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4. Analysis of influence of object–detector distance error on the reconstructed object and probe in ptychographic imaging;AIP Advances;2022-06-01

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