Suppression of aliasing in multi-sensor scanning absolute profile measurement
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
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Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. New method to improve the accuracy in a sequential lateral shearing interferometer;Optical Engineering;2011-11-01
2. Improving the lateral resolution of a multi-sensor profile measurement method by non-equidistant sensor spacing;Optics Express;2010-07-12
3. Reduction of aliasing artifact in Micro CT;Acta Physica Sinica;2010
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