Maximum rate of change of the differential reflection phase shift with respect to the angle of incidence for light reflection at the surface of an absorbing medium-Reference-Cited by-同舟云学术

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Maximum rate of change of the differential reflection phase shift with respect to the angle of incidence for light reflection at the surface of an absorbing medium

Published:1989-04-01 Issue:7 Volume:28 Page:1365
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Azzam R. M. A.,El-Saba A. M.

Publisher

The Optical Society

Reference5 articles.

1. Definitions and conventions in ellipsometry

2. Aider: Angle-of-incidence-derivative ellipsometry and reflectometry

3. Aider (angle-of-incidence derivative ellipsometry and reflectometry) — Implementation and application

4. Stationary property of normal-incidence reflection from isotropic surfaces

5. Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Differential reflection phase shift under conditions of attenuated internal reflection;Journal of the Optical Society of America A;1999-07-01

2. Maximum rate of change of the differential reflection phase shift with respect to the angle of incidence for light reflection at the surface of an absorbing medium: Érratum;Applied Optics;1996-01-01

3. Contours of the constant third Brewster angle in the complex plane of a dielectric constant;Applied Optics;1995-12-01

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