Modulation bandwidth improvement of III-V/Si hybrid MOS optical modulator by reducing parasitic capacitance

Author:

Tang Hanzhi1,Li Qiang12,Ho Chong Pei13,Fujikata Junichi45,Noguchi Masataka46,Takahashi Shigeki4,Toprasertpong Kasidit1ORCID,Takagi Shinichi1,Takenaka Mitsuru1ORCID

Affiliation:

1. The University of Tokyo

2. Currently with Advanced Micro Foundry (AMF)

3. Currently with Institute of Microelectronics (IME)

4. Photonics Electronics Technology Research Association (PETRA)

5. Currently with Tokushima University

6. Currently with National Institute of Advanced Industrial Science and Technology (AIST)

Abstract

In this work, we numerically and experimentally examined the impact of parasitic capacitance on the modulation bandwidth of a III-V/Si hybrid metal-oxide-semiconductor (MOS) optical modulator. The numerical analysis revealed that the parasitic capacitance between the III-V membrane and the Si slab should be considered to achieve high-speed modulation, particularly in the case of a thick gate oxide. We also fabricated a high-speed InGaAsP/Si hybrid MOS optical modulator with a low capacitance using a SiO2-embedded Si waveguide. The fabricated device exhibited a modulation efficiency of 0.245 Vcm and a 3 dB bandwidth of up to 10 GHz. Clear eye patterns with 25 Gbps non-return-to-zero (NRZ) modulation and 40 Gbps 4-level pulse amplitude modulation (PAM-4) were obtained without pre-emphasis.

Funder

New Energy and Industrial Technology Development Organization

Core Research for Evolutional Science and Technology

Ministry of Education, Culture, Sports, Science and Technology

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics

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