Characterization of a highly photorefractive RF-sputtered SiO2-GeO2 waveguide-Reference-Cited by-同舟云学术

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Characterization of a highly photorefractive RF-sputtered SiO2-GeO2 waveguide

Published:2005 Issue:5 Volume:13 Page:1696
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Sebastiani S.,Conti G. Nunzi,Pelli S.,Righini G. C.,Chiasera A.,Ferrari M.,Tosello C.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Cited by 29 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical properties and concentration dependence of BaO-GeO2 in glass systems;Ceramics International;2023-07

2. Optical Properties according to BaO Addition for BaO-GeO2-La2O3-ZnO System;Korean Journal of Materials Research;2022-09-01

3. The half-metallic characteristic of Cr-doped rutile germanium oxide-based dilute magnetic semiconductor predicted by first-principles calculations;Indian Journal of Physics;2022-05-24

4. Co-, Fe-, Ni-doped and co-doped rutile GeO₂: insights from ab-initio calculations;Communications in Theoretical Physics;2022-04-01

5. A novel dual resonance long period waveguide grating based highly sensitive refractive index sensor with reduced temperature sensitivity;Optics Communications;2020-11

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