Experimental phase changes at the mica–silver interface illustrate the experimental accuracy of the central film thickness in a symmetrical three-layer interferometer
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Publisher
The Optical Society
Reference9 articles.
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1. Optical phase change at the interface between mica and thin silver film;Journal of Optics A: Pure and Applied Optics;2003-11-03
2. Thickness and refractive index measurements using multiple beam interference fringes (FECO);Journal of Colloid and Interface Science;2003-08
3. Direct Surface Force Measurement Techniques;Electrostatic Effects in Soft Matter and Biophysics;2001
4. Simultaneous determination of the thickness and optical constants of weakly absorbing thin films;Measurement Science and Technology;1998-03-01
5. Topographic Information from Multiple Beam Interferometry in the Surface Forces Apparatus;Langmuir;1997-07-01
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