Retroreflecting ellipsometer for measuring the birefringence of optical disk substrates
Author:
Publisher
The Optical Society
Reference19 articles.
1. Jones matrix analysis of magnetooptical media and read-back systems
2. Propagation characteristics of plate waves in a Z-cut X-propagation LiTaO3 thin plate
3. Birefringence-An important property of plastic substrates for magneto-optical storage disks
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5. Influence of birefringence on the signal quality of magnetooptic disks using polycarbonate substrates
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