Author:
Han Zehua,Wang Jizhou,Marshall Nathan,Wang Kai,Scully Marian O.,Sokolov Alexei V.
Abstract
An infrared wide-field microscopy based on the infrared-resonant third-order sum-frequency (ITS) process is demonstrated. Video-rate imaging was achieved. The resulting 0.9 µm resolution is much higher than the diffraction limit defined by the input wavelengths.