Real-time enhancement of defects in periodic patterns by use of a bacteriorhodopsin film
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference10 articles.
1. The P300: A system for automatic patterned wafer inspection
2. Holographic Optical Processing For Submicrometer Defect Detection
3. Patterned wafer inspection using laser holography and spatial frequency filtering
4. Real-time enhancement of defects in a periodic mask using photorefractive Bi_12SiO_20
5. Submicrometer defect enhancement in periodic structures by using photorefractive holography
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