The measurement of the diffusion coefficient of oxygen ions in the YBa2Cu3O7-x layer of the electro-resistance memory
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Published:2019-07-05
Issue:7
Volume:1
Page:82-86
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ISSN:0033-2097
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Container-title:PRZEGLĄD ELEKTROTECHNICZNY
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language:en
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Short-container-title:ELECTROTECHNICAL REVIEW
Publisher
Wydawnictwo SIGMA-NOT, sp. z.o.o.
Subject
Electrical and Electronic Engineering