Characterization and Modelling of Carrier Frequency Offset in OFDM Systems under Additive White Gaussian Noise
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Published:2024-08-01
Issue:8
Volume:1
Page:166-171
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ISSN:0033-2097
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Container-title:PRZEGLĄD ELEKTROTECHNICZNY
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language:en
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Short-container-title:ELECTROTECHNICAL REVIEW
Publisher
Wydawnictwo SIGMA-NOT, sp. z.o.o.