An ellipsometric analysis of CVD-diamond films at infrared wavelengths-Reference-Cited by-同舟云学术

An ellipsometric analysis of CVD-diamond films at infrared wavelengths

Published:2003 Issue:5 Volume:41 Page:967-972
ISSN:0008-6223
Container-title:Carbon
language:en
Short-container-title:Carbon

Author:

Fang Zhijun,Xia Yiben,Wang Linjun,Zhang Weili,Ma Zheguo,Zhang Minglong

Publisher

Elsevier BV

Subject

General Chemistry,General Materials Science

Reference8 articles.

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2. Spectroscopic ellipsometry: a new tool for nondestructive depth profiling and characterization of interfaces;McMarr;Appl Phys Lett,1986

3. The calculation of thin film parameters from spectroscopic ellipsometry data;Jellison;Thin Solid Films,1990

4. Application of real-time spectroscopic ellipsometry for the development of low-temperature diamond film growth processes;Collins;Thin Solid Films,1998

5. A new quantitative determination of stress by Raman spectroscopy in diamond grown on alumina;Fang;J Phys: Condensed Matter,2002

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